发明名称 |
Disk protrusion detection/flatness measurement circuit and disk glide tester |
摘要 |
The present invention relates to a disk protrusion detection/flatness measurement circuit and a disk glide tester, in which protrusion detection and average value calculation can be performed without switching signal processing circuits of two systems, one for the protrusion detection of a disk and the other for the average value calculation with respect to a track or a sector of the disk. This also makes it possible to reduce the size of the measurement circuit. In the protrusion detection/flatness measurement circuit, a signal from a protrusion detection sensor is amplified and converted from an analog signal to a digital signal. The signal passes through a band-pass filter to obtain a digital signal with a predetermined bandwidth. Then, peak detection and average value calculation processes are applied in parallel to the obtained digital signal. Thus, pass/fail decision of the disk can be made based on the detected peak and average values.
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申请公布号 |
US8457926(B2) |
申请公布日期 |
2013.06.04 |
申请号 |
US20100841599 |
申请日期 |
2010.07.22 |
申请人 |
SHITARA KENICHI;TOKUMARU YASUHIRO;HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
SHITARA KENICHI;TOKUMARU YASUHIRO |
分类号 |
G01B5/20;G01B21/20;G06F17/40;G06F19/00 |
主分类号 |
G01B5/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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