发明名称 Inverted-trench grounded-source FET structure using conductive substrates, with highly doped substrates
摘要 This invention discloses an inverted field-effect-transistor (iT-FET) semiconductor device that includes a source disposed on a bottom and a drain disposed on a top of a semiconductor substrate. The semiconductor power device further comprises a trench-sidewall gate placed on sidewalls at a lower portion of a vertical trench surrounded by a body region encompassing a source region with a low resistivity body-source structure connected to a bottom source electrode and a drain link region disposed on top of said body regions thus constituting a drift region. The drift region is operated with a floating potential said iT-FET device achieving a self-termination.
申请公布号 US8455320(B2) 申请公布日期 2013.06.04
申请号 US201213553152 申请日期 2012.07.19
申请人 HEBERT FRANCOIS;ALPHA AND OMEGA SEMICONDUCTOR INCORPORATED 发明人 HEBERT FRANCOIS
分类号 H01L21/336 主分类号 H01L21/336
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