发明名称 Ge quantum dots for dislocation engineering of III-N on silicon
摘要 A virtual substrate structure includes a crystalline silicon substrate with a first layer of III-N grown on the silicon substrate. Ge clusters or quantum dots are grown on the first layer of III-N and a second layer of III-N is grown on the Ge clusters or quantum dots and any portions of the first layer of III-N exposed between the Ge clusters or quantum dots. Additional alternating Ge clusters or quantum dots and layers of III-N are grown on the second layer of III-N forming an upper surface of III-N. Generally, the additional alternating layers of Ge clusters or quantum dots and layers of III-N are continued until dislocations in the III-N adjacent the upper surface are substantially eliminated.
申请公布号 US8455881(B2) 申请公布日期 2013.06.04
申请号 US201113235544 申请日期 2011.09.19
申请人 ARKUN ERDEM;CLARK ANDREW;TRANSLUCENT, INC. 发明人 ARKUN ERDEM;CLARK ANDREW
分类号 H01L29/15 主分类号 H01L29/15
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