发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE TREATMENT METHOD, AND SUBSTRATE TREATMENT DEVICE
摘要 <p>Provided: forming a specific element-containing layer by supplying a source gas to the substrate heated in a processing vessel, under a condition that a thermal decomposition reaction of the source gas is caused; changing the specific element-containing layer to a nitride layer by supplying a nitrogen-containing gas to the substrate; and changing the nitride layer to an oxynitride layer by supplying an oxygen-containing gas to the substrate, the source gas is sprayed in parallel to a surface of the substrate more strongly than a case of spraying the inert gas in parallel to the surface of the substrate in purging the inside of the processing vessel, by supplying an inert gas or a hydrogen-containing gas through the nozzle.</p>
申请公布号 KR20130057489(A) 申请公布日期 2013.05.31
申请号 KR20137010526 申请日期 2011.12.16
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 OTA YOSUKE;HIROSE YOSHIRO;AKAE NAONORI;TAKASAWA YUSHIN
分类号 H01L21/318;C23C16/40;H01L21/8247;H01L27/115 主分类号 H01L21/318
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