发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE TREATMENT METHOD, AND SUBSTRATE TREATMENT DEVICE |
摘要 |
<p>Provided: forming a specific element-containing layer by supplying a source gas to the substrate heated in a processing vessel, under a condition that a thermal decomposition reaction of the source gas is caused; changing the specific element-containing layer to a nitride layer by supplying a nitrogen-containing gas to the substrate; and changing the nitride layer to an oxynitride layer by supplying an oxygen-containing gas to the substrate, the source gas is sprayed in parallel to a surface of the substrate more strongly than a case of spraying the inert gas in parallel to the surface of the substrate in purging the inside of the processing vessel, by supplying an inert gas or a hydrogen-containing gas through the nozzle.</p> |
申请公布号 |
KR20130057489(A) |
申请公布日期 |
2013.05.31 |
申请号 |
KR20137010526 |
申请日期 |
2011.12.16 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
OTA YOSUKE;HIROSE YOSHIRO;AKAE NAONORI;TAKASAWA YUSHIN |
分类号 |
H01L21/318;C23C16/40;H01L21/8247;H01L27/115 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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