发明名称 ASTHENOPIA MEASUREMENT DEVICE, ELECTRONIC APPLIANCE, ASTHENOPIA MEASUREMENT METHOD, AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To measure three-dimensional asthenopia with high accuracy. <P>SOLUTION: An alternate frequency instruction part 13 of this asthenopia measurement device 1 changes an alternate frequency for changing over the display of three-dimensional images each having a different parallax from a low frequency to a high frequency, and instructs an image display control part 14 about the display by the changed alternate frequency. The image display control part 14 reads image data for making the three-dimensional image having the different parallax be displayed from an image database 12, changes over the image data by the alternate frequency instructed from the alternate frequency instruction part 13, and makes the image data be displayed on a display part 11. When an input part 15 receives an operation indicating that the image formation of the different three-dimensional image displayed on the display part 11 cannot be performed from a subject, a diagnostic part 16 acquires the alternate frequency when having received the operation. The image display control part 14 makes the content data of the three-dimensional image using a parallax amount corresponding to the alternate frequency acquired by the diagnostic part 16 be displayed on the display part 11. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013102952(A) 申请公布日期 2013.05.30
申请号 JP20110248725 申请日期 2011.11.14
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 OKAMOTO RYUTARO;ASANO JUNTA
分类号 A61B3/02;A61B3/08;G09G5/00;G09G5/36;H04N17/00 主分类号 A61B3/02
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