发明名称 |
METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE |
摘要 |
<p>A silicon carbide layer (19) provided with a main surface is formed on a substrate (1). A mask (17) that covers part of the main surface of the silicon carbide layer (19) is formed. Thermal etching is performed on the main surface of the silicon carbide layer (19), upon which the mask is formed (17), using a chlorine gas, in such a manner as to provide side surfaces (SS), which are inclined relative to the main surface, to the silicon carbide layer (19). A step in which thermal etching is performed is carried out in an atmosphere in which the partial pressure of the chlorine gas is not more than 50%.</p> |
申请公布号 |
WO2013077089(A1) |
申请公布日期 |
2013.05.30 |
申请号 |
WO2012JP75516 |
申请日期 |
2012.10.02 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD.;NATIONAL UNIVERSITY CORPORATION NARA INSTITUTE OFSCIENCE AND TECHNOLOGY |
发明人 |
MASUDA, TAKEYOSHI;HATAYAMA, TOMOAKI |
分类号 |
H01L21/336;H01L21/205;H01L21/302;H01L21/3065;H01L21/329;H01L29/06;H01L29/12;H01L29/739;H01L29/78;H01L29/861;H01L29/868 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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