发明名称 METHOD FOR MANUFACTURING OF POLY SILICON LAYER, MEHTOD FOR MANUFACTURING OF THIN FILM TRANSISTOR USING THE SAME
摘要 <p>PURPOSE: A method for manufacturing a polycrystalline silicon layer and a method for manufacturing a thin film transistor using the same are provided to easily form polycrystalline silicon by reducing the crystallization energy of an amorphous silicon layer through a capping layer with a larger thermal expansion coefficient than the amorphous silicon layer. CONSTITUTION: A buffer layer(110) is formed on a substrate(100). An amorphous silicon layer is formed on the buffer layer. A capping layer(130) is formed on the amorphous silicon layer. The thermal expansion coefficient of the capping layer is larger than the thermal expansion coefficient of the amorphous silicon layer. The amorphous silicon layer is crystallized into a polycrystalline silicon layer(125) by thermally processing the substrate. The capping layer is removed from the polycrystalline silicon layer. [Reference numerals] (AA) Removal</p>
申请公布号 KR20130056500(A) 申请公布日期 2013.05.30
申请号 KR20110122139 申请日期 2011.11.22
申请人 LG DISPLAY CO., LTD. 发明人 KWON, SE YEOUL;CHO, MIN GU;PARK, WEON SEO
分类号 H01L21/324;H01L21/336;H01L29/786 主分类号 H01L21/324
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