发明名称 |
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAME |
摘要 |
A method for manufacturing a semiconductor structure. The method includes the following steps: providing an SOI substrate, forming a gate stack on the SOI substrate, forming a flank on a side wall of the gate stack and forming a source/drain area on either side of the gate stack; forming a first metal layer on the surface of the entire semiconductor structure, and then removing the first metal layer; forming an amorphous semiconductor layer on the surface of the source/drain area; forming a second metal layer on the surface of the entire semiconductor structure, and then removing the second metal layer; and performing an annealing operation on the semiconductor structure. Correspondingly, also provided is a semiconductor structure. The present invention effectively reduces the contact resistance of the source/drain area. |
申请公布号 |
WO2013075349(A1) |
申请公布日期 |
2013.05.30 |
申请号 |
WO2011CN83329 |
申请日期 |
2011.12.01 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;YIN, HAIZHOU;XU, JING;LIU, YUNFEI |
发明人 |
YIN, HAIZHOU;XU, JING;LIU, YUNFEI |
分类号 |
H01L21/28;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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