发明名称 SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAME
摘要 A method for manufacturing a semiconductor structure. The method includes the following steps: providing an SOI substrate, forming a gate stack on the SOI substrate, forming a flank on a side wall of the gate stack and forming a source/drain area on either side of the gate stack; forming a first metal layer on the surface of the entire semiconductor structure, and then removing the first metal layer; forming an amorphous semiconductor layer on the surface of the source/drain area; forming a second metal layer on the surface of the entire semiconductor structure, and then removing the second metal layer; and performing an annealing operation on the semiconductor structure. Correspondingly, also provided is a semiconductor structure. The present invention effectively reduces the contact resistance of the source/drain area.
申请公布号 WO2013075349(A1) 申请公布日期 2013.05.30
申请号 WO2011CN83329 申请日期 2011.12.01
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;YIN, HAIZHOU;XU, JING;LIU, YUNFEI 发明人 YIN, HAIZHOU;XU, JING;LIU, YUNFEI
分类号 H01L21/28;H01L29/78 主分类号 H01L21/28
代理机构 代理人
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