发明名称 METHOD AND APPARATUS FOR MEASURING VOLTAGE OF ELEMENT TO BE INSPECTED
摘要 <P>PROBLEM TO BE SOLVED: To remove an influence of an offset value of a voltmeter in a measurement of an output voltage of an element to be inspected. <P>SOLUTION: First of all, a relay RLY11 is closed, a relay RLY12 is opened, and a voltage Vt1 between a reference potential terminal T1 and a predetermined voltage terminal T3 is measured by a voltmeter 2. Then, the relay RLY12 is closed, the relay RLY11 is opened, and a voltage Vt2 between the predetermined voltage terminal T3 and a measuring object voltage terminal T2 is measured by the voltmeter 2. An arithmetic processing unit 43 calculates a difference between the measured values of the volts Vt1 and Vt2 to obtain a voltage V between the reference potential terminal T1 and the measuring object volt terminal T2 and also offset an offset voltage contained in the respective measured values. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013104695(A) 申请公布日期 2013.05.30
申请号 JP20110246917 申请日期 2011.11.10
申请人 SHARP CORP 发明人 TACHIBANA KUNIHIKO
分类号 G01R19/00;G05F1/46 主分类号 G01R19/00
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