发明名称 PHASE SHIFT FOCUS MONITOR RETICLE, MANUFACTURING METHOD THEREOF AND METHOD FOR MONITORING FOCUS DIFFERENCE
摘要 The invention provides a phase shift focus monitor reticle, a manufacturing method thereof, and a method of monitoring focus difference using the phase shift focus monitor reticle. The phase shift focus monitor reticle comprises a shield comprising a plurality of light-transmitting portions with a certain width; and a glass layer positioned on the shield layer comprising a plurality of openings at the light-transmitting portions; wherein the width of the openings is half of the width of the light-transmitting portions; the depth of the openings is n*lambda/(N-1), wherein lambda is the wavelength of the lights incident on the phase shift focus monitor reticle in air, N is the refractive index of the glass layer, n is a positive integer. The invention can be applied to thicker photoresist and different process machines.
申请公布号 US2013137016(A1) 申请公布日期 2013.05.30
申请号 US201213688407 申请日期 2012.11.29
申请人 MICROELECTRONICS CORPORATION SHANGHAI HUALI;SHANGHAI HUALI MICROELECTRONICS CORPORATION 发明人 LI WENLIANG;WU PENG
分类号 G03F1/26 主分类号 G03F1/26
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