发明名称 |
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To improve characteristics of a semiconductor device. <P>SOLUTION: A semiconductor device of an embodiment comprises: (a) a MISFET arranged on an active region Ac surrounded by an element isolation region ST1 and including a semiconductor region 3; (b) an insulation layer BOX arranged under the active region Ac; (c) a p-type semiconductor region 1W arranged under the active region Ac via the insulation layer BOX; and (d) an n-type second semiconductor region 2W arrange under the p-type semiconductor region 1W and having a conductivity type opposite to the p-type. The p-type semiconductor region 1W includes a connection area CA extending from under the insulation layer BOX. The p-type semiconductor region 1W and a gate electrode G of the MISFET are connected by a shared plug SP1 formed by an integral conductive film extending from above the gate electrode G to above the connection area CA. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013105982(A) |
申请公布日期 |
2013.05.30 |
申请号 |
JP20110250493 |
申请日期 |
2011.11.16 |
申请人 |
RENESAS ELECTRONICS CORP |
发明人 |
HOTTA KATSUYUKI;IWAMATSU TOSHIAKI;MAKIYAMA HIDEKI;YAMAMOTO YOSHIKI |
分类号 |
H01L21/8244;H01L21/336;H01L21/768;H01L21/8234;H01L21/8238;H01L23/522;H01L27/08;H01L27/088;H01L27/092;H01L27/10;H01L27/11;H01L29/423;H01L29/49;H01L29/786 |
主分类号 |
H01L21/8244 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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