发明名称 Tunnel Field-Effect Transistor with Narrow Band-Gap Channel and Strong Gate Coupling
摘要 A semiconductor device and the methods of forming the same are provided. The semiconductor device includes a low energy band-gap layer comprising a semiconductor material; a gate dielectric on the low energy band-gap layer; a gate electrode over the gate dielectric; a first source/drain region adjacent the gate dielectric, wherein the first source/drain region is of a first conductivity type; and a second source/drain region adjacent the gate dielectric. The second source/drain region is of a second conductivity type opposite the first conductivity type. The low energy band-gap layer is located between the first and the second source/drain regions.
申请公布号 US2013137236(A1) 申请公布日期 2013.05.30
申请号 US201313741086 申请日期 2013.01.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 BHUWALKA KRISHNA KUMAR;GOTO KEN-ICHI
分类号 H01L29/66 主分类号 H01L29/66
代理机构 代理人
主权项
地址