发明名称 |
MATRIX SUBSTRATE AND INSPECTION METHOD OF MATRIX SUBSTRATE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a matrix substrate capable of reducing control resources for capacity inspection of pixels without adding any circuit for inspection. <P>SOLUTION: A matrix substrate 10 includes: a plurality of light emitting pixels 20 disposed in a matrix; and first control lines and second control lines each disposed corresponding to the plurality of light emitting pixels 20, and N-rows of the light emitting pixels 20 are set as a unit of an inspection block. Each of the inspection blocks is provided with a first control line and a second control line respectively. The matrix substrate 10 includes: first inspection control lines electrically connecting N of the first control lines to each other included in the inspection block and a first inspection terminal connected thereto; and N of second inspection control lines each electrically connecting one of the second control lines to each other selected from each of the inspection blocks and a second inspection terminal connected thereto. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013105159(A) |
申请公布日期 |
2013.05.30 |
申请号 |
JP20110251136 |
申请日期 |
2011.11.16 |
申请人 |
PANASONIC CORP |
发明人 |
SHIROMIZU HIROSHI;TAJIKA KENICHI |
分类号 |
G09G3/30;G09G3/20;H01L51/50;H05B33/12 |
主分类号 |
G09G3/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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