发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS
摘要 A method of manufacturing a semiconductor device, includes supplying a first etching gas and a second etching gas having a decomposition rate lower than that of the first etching gas from one end of a substrate accommodating region in a process chamber where a plurality of substrates are stacked while exhausting an inside of a process chamber from other end of the substrate accommodating region; and etching a first portion of the plurality of substrate at the one end of the substrate accommodating region using a portion of radicals generated from the first etching gas and second etching gas, and etching a second portion of the plurality of substrates at the other end of the substrate accommodating region using at least a portion of a remaining radicals of the radicals generated from the first etching gas and second etching gas.
申请公布号 US2013137272(A1) 申请公布日期 2013.05.30
申请号 US201313751517 申请日期 2013.01.28
申请人 HITACHI KOKUSAI ELECTRIC INC.;HITACHI KOKUSAI ELECTRIC INC. 发明人 ISHIBASHI KIYOHISA;MORIYA ATSUSHI
分类号 H01L21/461;H01L21/302;H01L21/306 主分类号 H01L21/461
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