| 摘要 |
<p>The method comprises performing M scanning processes (M greater than 1) for respective scanning of a detection area with a scanner (12), where a scanning process, measuring the lengths of free light paths d for each direction R in each of the scanning processes, determining the free light path D m a xmaximally measured in the M scanning processes and the free light path D m i nminimally measured in the M scanning processes for each of the N directions, and classifying a direction R jin a contour class. The method comprises performing M scanning processes (M greater than 1) for respective scanning of a detection area with a scanner (12), where a scanning process, measuring the lengths of free light paths d for each direction R in each of the scanning processes, determining the free light path D m a xmaximally measured in the M scanning processes and the free light path D m i nminimally measured in the M scanning processes for each of the N directions, and classifying a direction R jin a contour class when the maximally measured free light path and the minimally measured free light path differ at a predetermined limit value T, where a classification step remarkably means a classification of the associated light radiations than at a contour (14), which is fixed with respect to the scanner. The scanning process comprises the emission of N light radiations L iwhere i is different directions of circular detection area, and the detection of lights reflected in the detection area, where the direction R of the light radiations is equal for each of the M scanning process and the environment of the scanner is not equal to all M scanning processes.</p> |
