发明名称 Method of determining a calibration time interval for a measurement device
摘要 <p>A profound method of determining a calibration time interval (TI) for a specific measurement device of a given type to be used in a specific application, after which the specific device shall be calibrated, which is suitable in terms of costs and safety, is described, comprising the steps of: operating and regularly calibrating a statistically relevant number of devices of the given type, during each calibration of each of theses devices determining whether the device under calibration is compliant or non-compliant to a given specification, adjusting non-compliant devices in order to make them compliant again, and replacing them in case they are non-compliant after their adjustment, for each of these devices recording all operation time intervals (TBA i ) during which the respective device was operated unaltered prior to any of its adjustments or its replacement, based on the recorded operation time intervals (TBA i ) determining a probability density function (PDF(TBA)) for an operation time interval (TBA) after which devices of this type will require adjustment or replacement, determining a criticality (C) of the specific device representing a risk involved in operating the device in the specific application, and determining the calibration time interval (TI) as a time interval (TBA(± c )) for which according to the probability density function (PDF(TBA)) a probability (P) for a device of this type to require adjustment or replacement during this time interval (TBA(± c )) corresponds to a predetermined probability value (P(± c )) assigned to the criticality (C) of the specific device.</p>
申请公布号 EP2597436(A1) 申请公布日期 2013.05.29
申请号 EP20110190393 申请日期 2011.11.23
申请人 ENDRESS + HAUSER MESSTECHNIK GMBH+CO. KG 发明人 VAISSIERE, DIMITRI
分类号 G01F25/00;G01D18/00;G01K15/00;G01L27/00 主分类号 G01F25/00
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