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发明名称
X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS
摘要
申请公布号
EP2378279(A4)
申请公布日期
2013.05.29
申请号
EP20090834831
申请日期
2009.12.21
申请人
OMRON CORPORATION
发明人
MASUDA, MASAYUKI;SUGITA, SHINJI;KATO, NORIYUKI;MATSUNAMI, TSUYOSHI
分类号
G01N23/04
主分类号
G01N23/04
代理机构
代理人
主权项
地址
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