发明名称 |
Methods and devices for detecting single-event transients |
摘要 |
Methods and devices for detecting single-event transients in combinational logic circuits and other circuits. A sensing circuit detects a voltage or current deviation at a bulk contact node of a transistor. Output of the sensing circuit is amplified and used to flip a latch. Output of the latch may be evaluated and used in possible error correction measures.
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申请公布号 |
US8451028(B2) |
申请公布日期 |
2013.05.28 |
申请号 |
US201113069102 |
申请日期 |
2011.03.22 |
申请人 |
CHEN LI;ZHANG ZHICHAO;WANG TAO;UNIVERSITY OF SASKATCHEWAN |
发明人 |
CHEN LI;ZHANG ZHICHAO;WANG TAO |
分类号 |
H03K5/153 |
主分类号 |
H03K5/153 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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