发明名称 Contact etch stop layers of a field effect transistor
摘要 An exemplary structure for a field effect transistor according to at least one embodiment comprises a substrate comprising a surface; a gate structure comprising sidewalls and a top surface over the substrate; a spacer adjacent to the sidewalls of the gate structure; a first contact etch stop layer over the spacer and extending along the surface of the substrate; an interlayer dielectric layer adjacent to the first contact etch stop layer, wherein a top surface of the interlayer dielectric layer is coplanar with the top surface of the gate structure; and a second contact etch stop layer over the top surface of the gate structure.
申请公布号 US8450216(B2) 申请公布日期 2013.05.28
申请号 US20100849601 申请日期 2010.08.03
申请人 TEO LEE-WEE;ZHU MING;YOUNG BAO-RU;CHUANG HARRY-HAK-LAY;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 TEO LEE-WEE;ZHU MING;YOUNG BAO-RU;CHUANG HARRY-HAK-LAY
分类号 H01L21/302 主分类号 H01L21/302
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