发明名称 Process for minimizing electromigration in an electronic device
摘要 A process for reducing Ag electromigration in electronic circuitry includes the step of treating the electronic circuitry with an electromigration resistant composition. This process is useful in fabricating electronic devices having electronic circuitry that is close together, such as resistors, capacitors, and displays, e.g., a plasma display panel (PDP) or a liquid crystal display (LCD).
申请公布号 US8450931(B2) 申请公布日期 2013.05.28
申请号 US20060883992 申请日期 2006.05.09
申请人 ALVAREZ KHRISTOPHER EDWARD;SHEPHARD NICK EVAN;TONGE JAMES STEVEN;DOW CORNING CORPORATION 发明人 ALVAREZ KHRISTOPHER EDWARD;SHEPHARD NICK EVAN;TONGE JAMES STEVEN
分类号 H01J17/49 主分类号 H01J17/49
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