| 摘要 |
FIELD: test equipment.SUBSTANCE: method includes production of images of scanned surface and their transfer into time rows of data. Structural analysis of the produced time row of data is carried out to determine location and coordinates of defect contours, using the specified value of the sliding interval moved along the produced time row of data. At the same time multiple n even breakdown is carried out into equal subintervals, and the sum of differences is identified between maximum and minimum values of data in analysed subintervals. By data on accumulated sums, parameters of regression equation are defined for specification of a dynamic variation index. Definition of defect coordinates is carried out by the moment of changing sign of the dynamic index of variation to the opposite one, which certifies local change of the surface structure. An index of fractal size of defect contour is calculated, and results are compared with values of a reference scale, including types of surface defects, their maximum permissible size and maximum permissible values of fractal size. If fractal size of a defect exceeds maximum permissible value, a conclusion is made on impossibility to eliminate the defect.EFFECT: diagnostics of a surface structure based on calculation of a fractal size and a variation index with subsequent relation of a defect to a certain class.1 dwg |
