发明名称 |
APPARATUS FOR MEASURING ABSOLUTE DISPLACEMENT |
摘要 |
PURPOSE: An absolute dislocation measurement device is provided to improve accuracy of measuring a position without forming a target measurement pattern precisely. CONSTITUTION: An absolute dislocation measurement device comprises a target pattern(121), a signal sensing unit(122), and a control unit. The target patterns are formed on one surface of a target object to a moving direction. Valid units(E1-E14) generating set signals and invalid units(N1-N13) generating no set signals are alternately arranged at a first space(I1). The signal sensing unit includes a plurality of sensors(S1-S20) for sensing the set signals. The sensors are arranged on a moving route in a row at a second space(I2) narrower than the first space. The control unit controls the valid units to generate the set signals and determines a current location of the target object according to output signals of the sensors.
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申请公布号 |
KR20130053342(A) |
申请公布日期 |
2013.05.23 |
申请号 |
KR20110119130 |
申请日期 |
2011.11.15 |
申请人 |
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, CHOSUN UNIVERSITY |
发明人 |
LEE, JIN YI;KIM, JUNG MIN;JUN, JONG WOO |
分类号 |
G01B7/00 |
主分类号 |
G01B7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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