发明名称 LITHOGRAPHIC MASK AND METHOD OF MANUFACTURING LITHOGRAPHIC MASK
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithographic mask that has a structure used to pattern a protective barrier structure on a semiconductor wafer and has a region in the mask insulated. <P>SOLUTION: The lithographic mask includes a first layer formed of a conductor and having a groove and a second layer including a region, a section, and a grooved transparent structure surrounding the section. The first layer and second layer are so formed as to reduce a difference in electric potential of the second layer, the grooved transparent structure separates the section and region from each other, and materials of the first layer and second layer are so selected that no difference in electric potential is generated between the section and the region. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013101387(A) 申请公布日期 2013.05.23
申请号 JP20130018672 申请日期 2013.02.01
申请人 ADVANCED MASK TECHNOLOGY CENTER GMBH & CO KG 发明人 ROLFF HAIKO;BYLOOS CARLA;NOELSCHER CHRISTOPH;MORGANA NICOLO;KOEHLE RODERICK;MOUKARA MOLELA;NEUBAUER RALF;PFORR RAINER;SAVIGNAC DOMINIQUE
分类号 G03F1/30;G03F1/00 主分类号 G03F1/30
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