发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device for high power application using a new semiconductor material with high mass productivity. <P>SOLUTION: Using a GRTA apparatus, a first oxide semiconductor film is heated. Oxygen is added to the heated first oxide semiconductor film to form a second oxide semiconductor film. Using the GRTA apparatus, the oxygen-added second oxide semiconductor film is heated. The GRTA apparatus is an apparatus for heat treatment using a high-temperature gas, and the use of the GRTA apparatus enables high-temperature heat treatment in a short time. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013102191(A) |
申请公布日期 |
2013.05.23 |
申请号 |
JP20130002436 |
申请日期 |
2013.01.10 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;SAKATA JUNICHIRO;OHARA HIROKI |
分类号 |
H01L21/336;G02F1/1368;H01L29/786;H01L51/50 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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