发明名称 Forming Low Stress Joints Using Thermal Compress Bonding
摘要 A method of forming a bump structure includes providing a first work piece including a dielectric layer having a top surface; placing a second work piece facing the first work piece; placing a heating tool contacting the second work piece; and heating the second work piece using the heating tool to perform a reflow process. A first solder bump between the first and the second work pieces is melted to form a second solder bump. Before the second solder bump solidifies, pulling the second work piece away from the first work piece, until an angle formed between a tangent line of the second solder bump and the top surface of the dielectric layer is greater than about 50 degrees, wherein the tangent line is drawn at a point where the second solder bump joins the dielectric layer.
申请公布号 US2013128486(A1) 申请公布日期 2013.05.23
申请号 US201213729978 申请日期 2012.12.28
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HUANG KUEI-WEI;LIN WEI-HUNG;WANG LIN-WEI;JANG BOR-PING;CHENG MING-DA;LIU CHUNG-SHI
分类号 B23K31/02;H05K1/14;H05K1/18 主分类号 B23K31/02
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