发明名称 P-Type Amorphous GaNAs Alloy as Low Resistant Ohmic Contact to P-Type Group III-Nitride Semiconductors
摘要 A new composition of matter is described, amorphous GaN1-xAsx:Mg, wherein 0<x<1, and more preferably 0.1<x<0.8, which amorphous material is of low resistivity, and when formed as a thin, heavily doped film may be used as a low resistant p-type ohmic contact layer for a p-type group III-nitride layer in such applications as photovoltaic cells. The layer may be applied either as a conformal film or a patterned layer. In one embodiment, as a lightly doped but thicker layer, the amorphous GaN1-xAsx:Mg film can itself be used as an absorber layer in PV applications. Also described herein is a novel, low temperature method for the formation of the heavily doped amorphous GaN1-xAsx:Mg compositions of the invention in which the doping is achieved during film formation according to MBE methods.
申请公布号 US2013126892(A1) 申请公布日期 2013.05.23
申请号 US201213475420 申请日期 2012.05.18
申请人 YU KIN MAN;WALUKIEWICZ WLADYSLAW;LEVANDER ALEJANDRO X.;NOVIKOV SERGEI V.;FOXON C. THOMAS;THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 YU KIN MAN;WALUKIEWICZ WLADYSLAW;LEVANDER ALEJANDRO X.;NOVIKOV SERGEI V.;FOXON C. THOMAS
分类号 H01L29/20;H01L21/04 主分类号 H01L29/20
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