发明名称 |
STRAINED STRUCTURES OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A strained structure of a semiconductor device is provided to improve performance by arranging an STI on one surface of a gate stack. CONSTITUTION: A substrate includes a main surface. A gate stack(210) is formed on the main surface of the substrate. An STI(Shallow Trench Isolation)(204) is arranged on one surface of the gate stack. A cavity(222) is filled with a strained structure. The strained structure is distributed between the gate stack and the STI. |
申请公布号 |
KR20130053360(A) |
申请公布日期 |
2013.05.23 |
申请号 |
KR20120004986 |
申请日期 |
2012.01.16 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
WU CHENG HSIEN;KO CHIH HSIN;WANN CLEMENT HSINGJEN |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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