发明名称 Extending Radiation Tolerance By Localized Temperature Annealing Of Semiconductor Devices
摘要 A method of increasing the operating life of a semiconductor device that is to be used in a harsh ionizing radiation environment including determining heating criteria for annealing the device; installing the device in an electronic apparatus; and heating the installed device with a local heating source in accordance with the heating criteria.
申请公布号 US2013126508(A1) 申请公布日期 2013.05.23
申请号 US201113309393 申请日期 2011.12.01
申请人 SALZMAN JAMES FRED;HADSELL CHARLES CLAYTON;TEXAS INSTRUMENTS INCORPORATED 发明人 SALZMAN JAMES FRED;HADSELL CHARLES CLAYTON
分类号 H05B1/00;G08B17/10;H01L21/66 主分类号 H05B1/00
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