发明名称 OPTICAL MICROSCOPY PROBE FOR SCANNING MICROSCOPY OF AN ASSOCIATED OBJECT
摘要 The present invention discloses an optical microscopy probe (10) for scanning microscopy imaging of object (O). The probe has an optical window (22), and an optical guide (2) having an objective lens (6) rigidly coupled to an end portion of the optical guide. The optical guide is displaceably mounted in a transverse direction of the housing (21) so as to enable optical scanning in a region of interest (ROI). A relay lens unit (25) is rigidly mounted at the distal end (23) of the probe and it has a first lens (25a), a second lens (25b) and a mirror (25c), the relay lens unit being optically arranged relative to the objective lens for allowing scanning microscopy through the optical window of the housing. The invention is advantageous for obtaining an improvement in the available field of view of the probe because the cooperation between the displaceable objective lens and the relay lens unit may compensate for the relative limited free working distance of the objective lens.
申请公布号 WO2013072796(A1) 申请公布日期 2013.05.23
申请号 WO2012IB56039 申请日期 2012.10.31
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 HENDRIKS, BERNARDUS, HENDRIKUS, WILHELMUS;BIERHOFF, WALTHERUS, CORNELIS, JOZEF;MIHAJLOVIC, NENAD
分类号 G02B21/00;A61B1/00 主分类号 G02B21/00
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