| 摘要 |
<P>PROBLEM TO BE SOLVED: To allow smear signals to be reduced. <P>SOLUTION: A solid-state imaging element photoelectrically converts light made incident and accumulates signal charges obtained in light receiving sections constituting pixels. At the time of reading of the signal charges, reading voltages are applied to transfer electrodes, and the reading of the signal charges from the light receiving sections to charge transfer channel regions is performed. In the charge transfer channel regions, packets in which the signal charges are actually accumulated and empty packets in which the signal charges are not accumulated are formed in response to the voltages applied to the transfer electrodes. The signal charges read from the light receiving sections are accumulated in the packets. In this case, the solid-state imaging element decreases potential depths of parts of regions of the empty packets of the charge transfer channel regions and causes unnecessary charges to be hardly accumulated in the empty packets. This technique can be applied to an imaging device. <P>COPYRIGHT: (C)2013,JPO&INPIT |
