| 摘要 |
PURPOSE: A flash memory card/embedded type memory card test device is provided to reduce a test time by performing a parallel test regardless of the structure of an automatic test system. CONSTITUTION: A response-recognition clock mask unit(100) is connected between a test device(10) and a target chip. The response-recognition clock mask unit logically combines test data and a command with a predetermined match condition by applying the test data and command outputted from the test device to each test target chip or by detecting an individual response signal of each test target chip. The response-recognition clock mask unit immediately decides whether there is a mask of another clock with respect to the corresponding DUT with the combined result and transfers the result to the DUT. The response-recognition clock mask unit includes a match condition register(111), a match unit(110) and a clock mask unit(120). The match unit detects an individual response signal(CMD, DAT0-7) of each test target chip with respect to the test data and command applied to each test target chip from the test device, and logically compares the signal with the condition predetermined in the match condition register. The clock mask unit combines the compared result with each DUT drive.
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