发明名称 |
Method for measuring I-V characteristics of solar cell, and solar cell |
摘要 |
An aspect of the invention provides a method for measuring I-V characteristics of a solar cell, the solar cell comprising a plurality of fine line-shaped electrodes formed on a first surface in a predetermined direction; and a coupling line formed on the first surface that electrically couples at least two fine line-shaped electrodes among the plurality of fine line-shaped electrodes, the coupling line having a line width larger than a line width of the fine line-shaped electrodes. The method includes: contacting a probe pin for voltage measurement with the coupling line; contacting two or more probe pins for current measurement electrically connected to each other with two or more fine line-shaped electrodes including the fine line-shaped electrodes coupled to each other by the coupling line among the plurality of fine line-shaped electrodes; and measuring I-V characteristics while irradiating the first surface with light.
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申请公布号 |
US8446145(B2) |
申请公布日期 |
2013.05.21 |
申请号 |
US20100700910 |
申请日期 |
2010.02.05 |
申请人 |
TAIRA SHIGEHARU;NISHIWAKI TAKESHI;SANYO ELECTRIC CO., LTD. |
发明人 |
TAIRA SHIGEHARU;NISHIWAKI TAKESHI |
分类号 |
G01R1/06 |
主分类号 |
G01R1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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