发明名称 Method for measuring I-V characteristics of solar cell, and solar cell
摘要 An aspect of the invention provides a method for measuring I-V characteristics of a solar cell, the solar cell comprising a plurality of fine line-shaped electrodes formed on a first surface in a predetermined direction; and a coupling line formed on the first surface that electrically couples at least two fine line-shaped electrodes among the plurality of fine line-shaped electrodes, the coupling line having a line width larger than a line width of the fine line-shaped electrodes. The method includes: contacting a probe pin for voltage measurement with the coupling line; contacting two or more probe pins for current measurement electrically connected to each other with two or more fine line-shaped electrodes including the fine line-shaped electrodes coupled to each other by the coupling line among the plurality of fine line-shaped electrodes; and measuring I-V characteristics while irradiating the first surface with light.
申请公布号 US8446145(B2) 申请公布日期 2013.05.21
申请号 US20100700910 申请日期 2010.02.05
申请人 TAIRA SHIGEHARU;NISHIWAKI TAKESHI;SANYO ELECTRIC CO., LTD. 发明人 TAIRA SHIGEHARU;NISHIWAKI TAKESHI
分类号 G01R1/06 主分类号 G01R1/06
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