发明名称 Strained semiconductor devices and methods of fabricating strained semiconductor devices
摘要 A structure and method of fabricating the structure. The structure includes a first region of a semiconductor substrate separated from a second region of the semiconductor substrate by trench isolation formed in the substrate; a first stressed layer over the first region; a second stressed layer over second region; the first stressed layer and second stressed layer separated by a gap; and a passivation layer on the first and second stressed layers, the passivation layer extending over and sealing the gap.
申请公布号 US8445965(B2) 申请公布日期 2013.05.21
申请号 US20100940115 申请日期 2010.11.05
申请人 ANDERSON BRENT A.;NOWAK EDWARD J.;RANKIN JED H.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ANDERSON BRENT A.;NOWAK EDWARD J.;RANKIN JED H.
分类号 H01L27/12 主分类号 H01L27/12
代理机构 代理人
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