发明名称 Semiconductor having a high aspect ratio via
摘要 The present disclosure provides various embodiments of a via structure and method of manufacturing same. In an example, a method for forming a via structure includes forming a via in a semiconductor substrate, wherein via sidewalls of the via are defined by the semiconductor substrate; forming a dielectric layer on the via sidewalls; removing the dielectric layer from a portion of the via sidewalls; and forming a conductive layer to fill the via, wherein the conductive layer is disposed over the dielectric layer and the portion of the via sidewalls. In an example, the dielectric layer is an oxide layer.
申请公布号 US8445380(B2) 申请公布日期 2013.05.21
申请号 US201213481550 申请日期 2012.05.25
申请人 HSIEH YUAN-CHIH;CHU RICHARD;WU MING-TUNG;LIU MARTIN;CHAO LAN-LIN;TSAI CHIA-SHIUNG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HSIEH YUAN-CHIH;CHU RICHARD;WU MING-TUNG;LIU MARTIN;CHAO LAN-LIN;TSAI CHIA-SHIUNG
分类号 H01L21/44 主分类号 H01L21/44
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