发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>PURPOSE: A semiconductor device and a manufacturing method thereof are provided to reduce power consumption by injecting impurities for controlling a threshold voltage into a gate insulation layer. CONSTITUTION: A gate insulation layer is formed on a substrate and includes impurities for controlling a threshold voltage. The substrate includes an NMOSFET region. The impurities for controlling the threshold voltage include nitrogen. A metal electrode(45) is formed on the gate insulation layer. An interfacial layer(43) is formed between the substrate and the gate insulation layer.</p>
申请公布号 KR20130051283(A) 申请公布日期 2013.05.20
申请号 KR20110116543 申请日期 2011.11.09
申请人 SK HYNIX INC. 发明人 JI, YUN HYUCK;KIM, BEOM YONG
分类号 H01L29/78;H01L21/336;H01L27/092 主分类号 H01L29/78
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