发明名称 DICING TAPE FOR SEMICONDUCTOR PROCESSING
摘要 <P>PROBLEM TO BE SOLVED: To provide a dicing adhesive tape for semiconductor processing which has adhesive force for sufficiently holding a wafer in a process for applying dicing processing to a semiconductor wafer and prevents an individualized package from being adhered to a tray or a device after package dicing. <P>SOLUTION: In a dicing tape for semiconductor processing, a radiation hardening type adhesive layer is formed on at least one side of a base film, the adhesive layer is made of resin composition having an acrylic polymer as a base polymer, the thickness of the adhesive layer is 10 to 30 &mu;m, adhesive force after radiation exposure to SUS304 based on JIS Z0237 of the adhesive layer is 90&deg;, when a peeling-off test is performed, tape width is 1.0 to 2.0 N/25 mm, and peak intensity of a probe tack after radiation exposure under an atmosphere condition of the adhesive layer is 50 to 150 mN/mm<SP POS="POST">2</SP>. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013098224(A) 申请公布日期 2013.05.20
申请号 JP20110237223 申请日期 2011.10.28
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 AKUTSU AKIRA
分类号 H01L21/301;C09J7/02;C09J133/00;C09J133/08 主分类号 H01L21/301
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