发明名称 CIRCUIT VERIFICATION DEVICE AND CIRCUIT VERIFICATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To simplify a configuration in which parameters required for simulating a semiconductor device are read. <P>SOLUTION: A circuit verification device comprises: means (140) that inputs a signal for emulation of a semiconductor device (102), on which a logic circuit based on a hardware description language is formed, to the device; means (110) that executes simulation by the hardware description language corresponding to the logic circuit; means (107) that obtains parameters related to the simulation from the device; means (111) that applies the obtained parameters to a simulator; and means (130) that corrects the logic circuit before obtaining the parameters. In correction of the logic circuit, the following are added: bypass wiring (101A), which allows storage elements storing the parameters in the logic circuit to operate as ring-type shift registers; and a read part (101B), which reads parameters of each of the storage elements via the bypass wiring. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013093041(A) 申请公布日期 2013.05.16
申请号 JP20120284817 申请日期 2012.12.27
申请人 NEC CORP 发明人
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
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