发明名称 SEMICONDUCTOR PROCESS FOR REMOVING OXIDE LAYER
摘要 A semiconductor process for removing oxide layers comprises the steps of providing a substrate having an isolation structure and a pad oxide layer, performing a dry cleaning process and a wet cleaning process to remove said pad oxide layer, forming a sacrificial oxide layer on said substrate, and performing an ion implantation process to form doped well regions on both sides of the isolation structure.
申请公布号 US2013122684(A1) 申请公布日期 2013.05.16
申请号 US201113293144 申请日期 2011.11.10
申请人 HSUAN TENG-CHUN;GUO TED MING-LANG;CHIEN CHIN-CHENG 发明人 HSUAN TENG-CHUN;GUO TED MING-LANG;CHIEN CHIN-CHENG
分类号 H01L21/265;H01L21/76 主分类号 H01L21/265
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