发明名称 CONCEPT FOR DETERMINING A MEASURE FOR A DISTORTION CHANGE IN A SYNTHESIZED VIEW DUE TO DEPTH MAP MODIFICATIONS
摘要 An apparatus for determining a measure for a distortion change of a first view synthesized from a second view, caused by a modification of a depth map of the second view from a first state (s D ) to a second state (formula I),is configured to, starting from a current synthesis state of the first view corresponding to a synthesis from the second view (s T ) having the depth map modified to the second state (formula I) in an already processed portion (formula II) of the depth map and having the depth map unmodified at the first state (s D ) in an yet to be processed portion (formula III) of the depth map, compute (40, 42, 44, 48) a possible successor synthesis state (s' T ) corresponding to a synthesis of the first view from the second view (s T ) having the depth map modified to the second state (formula I) in an already processed portion (formula II) plus a currently processed portion (B N ) and having the depth map unmodified at the first state (s D ) in the yet to be processed portion (formula II) without the currently processed portion; and determine (46; cp. eq. 32) a distortion change (DeltaD BetaN ) of a distortion of the current synthesis state (s' T ) of the first view relative to an undistorted version (S' Ref ) of the first view to a distortion of the possible successor synthesis state (s' T ) of the first view relative to the undistorted version (S' Ref ) of the first view.
申请公布号 WO2013068457(A1) 申请公布日期 2013.05.16
申请号 WO2012EP72128 申请日期 2012.11.08
申请人 FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. 发明人 TECH, GERHARD;MUELLER, KARSTEN;WIEGAND, THOMAS
分类号 G06T15/20;H04N13/00;H04N13/02 主分类号 G06T15/20
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