发明名称 MEASURING APPARATUS, MEASURING METHOD, AND PARAMETER SETTING METHOD
摘要 [Problem] To provide a measuring apparatus having further reduced size, a measuring method, and a parameter setting method. [Solution] This measuring apparatus is provided with: a light receiving element, which is provided at a position facing a region to be measured, said region having disposed therein a subject to be measured, and which makes light form an image, said light having been transmitted from the region to be measured; a plurality of light emitting elements, which are disposed at the periphery of the light receiving element, and output light for measuring the subject to be measured; and a reflective optical element, which is provided above the light emitting elements, and guides, to the region to be measured, the light emitted from the light emitting elements. The light receiving surface of the light receiving element, and the light output surfaces of the light emitting elements are positioned on a same plane, the light emitted from the light emitting elements is reflected by the reflective optical element, and the center lines of the light emitted from respective light emitting elements pass through substantially the center of the region to be measured.
申请公布号 WO2013069367(A1) 申请公布日期 2013.05.16
申请号 WO2012JP73035 申请日期 2012.09.10
申请人 SONY CORPORATION;TORIUMI, YOICHI;KAWABE, HIDEO;KABASAWA, KENICHI;SUZUKI, TATSUYA;IMAI, HIROKAZU;UENO, MASATOSHI 发明人 TORIUMI, YOICHI;KAWABE, HIDEO;KABASAWA, KENICHI;SUZUKI, TATSUYA;IMAI, HIROKAZU;UENO, MASATOSHI
分类号 G01N21/27 主分类号 G01N21/27
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