发明名称 NONDESTRUCTIVE INSPECTION DEVICE AND METHOD FOR CORRECTING LUMINANCE DATA WITH NONDESTRUCTIVE INSPECTION DEVICE
摘要 This nondestructive inspection device (1) comprises an X-ray irradiator (20), a low-energy detector (32), a high-energy detector (42), a low-energy transmittance calculating unit (72), a high-energy transmittance calculating unit (74), a detecting unit (76), and a correcting unit (78). The calculating unit (72) calculates a value indicating the transmittance of transmitted X-rays in a low-energy range. The calculating unit (74) calculates a value indicating the transmittance of transmitted X-rays in a high-energy range. The detecting unit (76) detects details on the positional deviation of the X-ray irradiator (20) on the basis of the ratio between the transmittances calculated by the respective calculating units (72, 74). If the detecting unit (76) detects details on the positional deviation of the X-ray irradiator (20), the correcting unit (78) corrects X-ray luminance data, which have been detected by the detectors (32, 42), in accordance with said details on the positional deviation.
申请公布号 WO2013069354(A1) 申请公布日期 2013.05.16
申请号 WO2012JP71192 申请日期 2012.08.22
申请人 HAMAMATSU PHOTONICS K.K.;SUYAMA TOSHIYASU 发明人 SUYAMA TOSHIYASU
分类号 G01N23/04;G01T7/00;G21K5/00;G21K5/10 主分类号 G01N23/04
代理机构 代理人
主权项
地址