发明名称 AUTOMATIC MEASUREMENT OF BEAM QUALITY PARAMETERS
摘要 <p>The present invention relates to a detector unit, an imaging system, and a method of processing radiography data. In order to provide a detector unit for an X-ray imaging system which permits an improved image processing, taking into account the current physics of the X-ray beam, a detector unit (210) for an X-ray imaging system is provided, comprising a detector device (220) with a detector surface (230), and at least one reference structure (240), and a processing unit (250). The reference structure (250) has predetermined radiation attenuation properties and is located in front of the detector surface (230). The detector device (220) is configured to detect X-ray radiation and to provide respective radiography image signals to the processing unit (250). The processing unit (250) is configured to determine at least one parameter associated with the irradiation of said reference structure (240), and to process radiography image data based on the at least one determined parameter.</p>
申请公布号 WO2013068957(A1) 申请公布日期 2013.05.16
申请号 WO2012IB56254 申请日期 2012.11.08
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH 发明人 MAACK, HANNS-INGO
分类号 A61B6/04 主分类号 A61B6/04
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