Microscopic device and method for three-dimensional localization of punctiform objects in a sample

摘要

The device has detector unit (146,148) that receives light beams. The detector unit is set with detection surface (150,152) for detecting light spots. An evaluation unit (154) evaluates light spots in each light beam on respective detection surface of lateral XY position of associated punctiform object (114) and axial z-position of associated punctiform object. The evaluation unit stores z-position correction value to longitudinal chromatic aberration of detection optics (108). The evaluation unit corrects detected wavelength region associated with z-position correction value. An independent claim is included for a method for three-dimensional location of punctiform objects in sample.