| 摘要 |
PURPOSE: A semiconductor memory device and a test circuit thereof are provided to reduce test time by directly writing data in a memory cell in a test mode. CONSTITUTION: A memory cell array(210) includes a plurality of memory cells. A switching unit(240) is connected to a data input and output pad and controls a transmission path of data applied to the data input and output pad in response to a test mode signal. A write driver(250) drives the data from the switching unit and writes the data in the memory cell in a normal mode. A controller(260) transmits the data from the switching unit to the memory cell in a test mode. [Reference numerals] (210) Memory cell array; (230) Data input buffer; (240) Switching unit; (250) Write driver; (260) Controller; (262) Bidirectional access control unit |
