发明名称 Methods of forming semiconductor memory devices having vertically stacked memory cells therein
摘要 Methods of forming vertical nonvolatile memory devices utilize carbon-blocking sacrificial capping layers to increase device yield by reducing the likelihood that one or more vertically-stacked layers of materials will lift-off during fabrication. These capping layers may be provided to cover carbon-containing sacrificial layers that are highly polymerized.
申请公布号 US8440531(B2) 申请公布日期 2013.05.14
申请号 US201213448582 申请日期 2012.04.17
申请人 HAN TAE-JONG;KIM DAEWOONG;JANG KYUNG-TAE;KIM BONGCHEOL;KWON OHCHEL;SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN TAE-JONG;KIM DAEWOONG;JANG KYUNG-TAE;KIM BONGCHEOL;KWON OHCHEL
分类号 H01L21/336 主分类号 H01L21/336
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