发明名称 |
Positive resist composition, method of forming resist pattern and polymeric compound |
摘要 |
A positive resist composition including a base component (A') which exhibits increased solubility in an alkali developing solution under the action of acid and generates acid upon exposure, the base component (A') including a resin component (A1) having a structural unit (a0-1) represented by general formula (a0-1), a structural unit (a0-2) which generates acid upon exposure and a structural unit (a1) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group (wherein R1 represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms, R2 represents a divalent linking group, and R3 represents a cyclic group containing -SO2- within the ring skeleton thereof). |
申请公布号 |
US8440385(B2) |
申请公布日期 |
2013.05.14 |
申请号 |
US20100979076 |
申请日期 |
2010.12.27 |
申请人 |
HIRANO TOMOYUKI;SHIONO DAIJU;ARAI MASATOSHI;TOKYO OHKA KOGYO CO., LTD. |
发明人 |
HIRANO TOMOYUKI;SHIONO DAIJU;ARAI MASATOSHI |
分类号 |
G03F7/039;G03F7/20;G03F7/30 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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