发明名称 Semiconductor memory device and method for testing the same
摘要 A semiconductor memory device includes a memory cell array configured to include a plurality of memory cells, a plurality of bit lines respectively coupled to the plurality of memory cells, a first power-supply voltage supplying circuit configured to provide a first power-supply voltage to the memory cell array through the plurality of bit lines, a second power-supply voltage supplying circuit configured to provide a second power-supply voltage to the memory cell array through the plurality of bit lines, a first address selection circuit configured to couple a bit line selected by a first selection address to the first power-supply voltage supplying circuit, and a second address selection circuit configured to couple a bit line selected by a second selection address to the second power-supply voltage supplying circuit.
申请公布号 US8441846(B2) 申请公布日期 2013.05.14
申请号 US20100828019 申请日期 2010.06.30
申请人 KIM KYU SUNG;HYNIX SEMICONDUCTOR INC. 发明人 KIM KYU SUNG
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
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