| 摘要 |
PURPOSE: A semiconductor memory device and a semiconductor system are provided to store defect information about the semiconductor memory device even though a skew is generated due to the change of PVT. CONSTITUTION: A test circuit(1) applies a write command and data for a write operation and a read command for a read operation, and receives output data according to the read operation. A semiconductor memory device(2) stores the data in a memory cell in response to the write command and stores data with defect information in response to the read command. The data with the defect information is stored by synchronizing with a pulse generated when the level of the data with the defect information is shifted. [Reference numerals] (1) Test circuit; (2) Semiconductor memory device
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