发明名称 HEATING APPARATUS FOR HEATING HIGH TEMPERATURE LIGHTING TEST SYSTEM OF LIGHT EMITTING DIODE LEAD FRAME
摘要 PURPOSE: An apparatus for testing a lead in an LED high temperature lighting test system is provided to judge pass/fail of a lead in an LED lead frame accurately, by applying a voltage in contacting the lead in the LED lead frame from the side as comprising a probe to apply the voltage to the lead in the LED lead frame. CONSTITUTION: An upper side test part(210) heats a lead to maintain a constant temperature, and pushes the lead with a jig so that the lead is unable to move during the test. A lower part test part(220) comprises a probe(223) contacting with the side of the lead, and applied a voltage through the probe.
申请公布号 KR20130049429(A) 申请公布日期 2013.05.14
申请号 KR20110114441 申请日期 2011.11.04
申请人 3PI 发明人 KIM, JAE KWANG;SONG, HYUN
分类号 G01R31/26;G01R31/02;H01L21/66 主分类号 G01R31/26
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