发明名称 |
HEATING APPARATUS FOR HEATING HIGH TEMPERATURE LIGHTING TEST SYSTEM OF LIGHT EMITTING DIODE LEAD FRAME |
摘要 |
PURPOSE: An apparatus for testing a lead in an LED high temperature lighting test system is provided to judge pass/fail of a lead in an LED lead frame accurately, by applying a voltage in contacting the lead in the LED lead frame from the side as comprising a probe to apply the voltage to the lead in the LED lead frame. CONSTITUTION: An upper side test part(210) heats a lead to maintain a constant temperature, and pushes the lead with a jig so that the lead is unable to move during the test. A lower part test part(220) comprises a probe(223) contacting with the side of the lead, and applied a voltage through the probe. |
申请公布号 |
KR20130049429(A) |
申请公布日期 |
2013.05.14 |
申请号 |
KR20110114441 |
申请日期 |
2011.11.04 |
申请人 |
3PI |
发明人 |
KIM, JAE KWANG;SONG, HYUN |
分类号 |
G01R31/26;G01R31/02;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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