| 摘要 |
PURPOSE: A semiconductor system including a data output circuit is provided to prevent operation errors by preventing the collision of data with defect information. CONSTITUTION: A first semiconductor chip(1) outputs first data with defect information by performing a parallel test according to a multichip parallel test signal and a first single chip parallel test signal. A second semiconductor chip outputs second data with the defect information by performing the parallel test according to the multichip parallel test signal and a second single chip parallel test signal. A data receiving unit(4) receives the first data and the second data through a data channel as the input data. [Reference numerals] (1) First semiconductor chip; (2) Second semiconductor chip; (41) Switch unit
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